论文信息: Countrywide inter-epidemic region migration pattern suggests the role of southwestern population to wheat stripe rust epidemics in China. Muhammad Awais, Sajid Ali, Meng Ju, Wei Liu, Gensheng Zhang, Zedong Zhang, Zejian Li, Xinyao Ma, Lin Wang, Zhimin Du, Xiaxia Tian, Qingdong Zeng, Zhensheng Kang*, Jie Zhao*. Environmental Microbiology, 2022, doi:10.1111/1462-2920.16096
JCR分区Q1，中科院大类二区，IF: 5.476
论文摘要：Understanding countrywide pathogen population structure and interepidemic region spread is crucial for deciphering crop potential losses. Wheat stripe rust caused by Puccinia striiformis f. sp. tritici is a destructive disease that affects worldwide wheat production, widespread in China, representing largest epidemic region globally. This study aimed to understand the population structure and migration route of P. striiformis f. sp. tritici across China based on sampling from 15 provinces representing six epidemic zones, viz., over-summering, over-wintering, eastern, Yun-Gui, Xinjiang and Tibet epidemic regions. High genotypic diversity was recorded in over-summering, Tibet and over-wintering epidemic regions. Epidemic regions partly explain population subdivision with variable divergence ( FST = 0.005–0.344). Xinjiang and Tibet epidemic regions were independent epidemic zones with least sharing of genotypes. Among other epidemic zones, i.e. over-summering, over-wintering, eastern and Yun-Gui epidemic zones, re-sampling MLGs, clustering-based structure, DAPC analyses, relative migration and low divergence (FST from 0.006 to 0.073) revealed frequent geneflow. Yun-Gui epidemic regions, with a potential for both over-summering and over-wintering, could play an important role in causing epidemics in main wheat-cultivating areas of China. High diversity, recombination signatures and inter-epidemic region migration patterns need to be considered in host-resistant cultivar development in China and neighbouring countries, considering risk of long-distance migration capacity of pathogen.
原文链接：https://sfamjournals.onlinelibrary.wiley.com/doi/epdf/10.1111/1462-2920.16096
